3,791 Results for : caused
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Rudford, L: RSI, Repetitive Strain Injury Caused by Electron
Erscheinungsdatum: 30.09.2013, Medium: Taschenbuch, Einband: Kartoniert / Broschiert, Titel: RSI, Repetitive Strain Injury Caused by Electronic Gadgets, Laptops, PC's and Mobile Phones. Neck Pain? Shoulder Pain? Wrist Pain? Thumb Pain? It Coul, Autor: Rudford, Lucy, Verlag: IMB Publishing, Sprache: Englisch, Schlagworte: MEDICAL // General, Rubrik: Medizin // Allgemeines, Lexika, Seiten: 170, Informationen: Paperback, Gewicht: 256 gr, Verkäufer: averdo- Shop: averdo
- Price: 20.59 EUR excl. shipping
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Pompano, Stephenie: The Deception and Betrayal Caused by a Cheating Spouse
Erscheinungsdatum: 22.07.2010, Medium: Buch, Einband: Gebunden, Titel: The Deception and Betrayal Caused by a Cheating Spouse, Autor: Pompano, Stephenie, Verlag: Xlibris, Sprache: Englisch, Schlagworte: BIOGRAPHY & AUTOBIOGRAPHY // Women // Biografien: allgemein, Rubrik: Belletristik // Biographien, Erinnerungen, Seiten: 62, Informationen: HC gerader Rücken mit Schutzumschlag, Gewicht: 271 gr, Verkäufer: averdo- Shop: averdo
- Price: 33.79 EUR excl. shipping
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Isom II, O: Wounds Caused by Gossip Attitudes and Conflicts
Erscheinungsdatum: 14.03.2014, Medium: Buch, Einband: Gebunden, Titel: Wounds Caused by Gossip Attitudes and Conflicts Within the Church, Titelzusatz: How to Overcome Evil Attitudes and Problems Within the Church, Autor: Isom II, O. C., Verlag: AuthorHouse, Sprache: Englisch, Schlagworte: BUSINESS & ECONOMICS // Workplace Culture, Rubrik: Wirtschaft // Allgemeines, Lexika, Geschichte, Seiten: 306, Informationen: HC gerader Rücken kaschiert, Gewicht: 625 gr, Verkäufer: averdo- Shop: averdo
- Price: 37.59 EUR excl. shipping
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Isom II, O: Wounds Caused by Gossip Attitudes and Conflicts
Erscheinungsdatum: 14.03.2014, Medium: Taschenbuch, Einband: Kartoniert / Broschiert, Titel: Wounds Caused by Gossip Attitudes and Conflicts Within the Church, Titelzusatz: How to Overcome Evil Attitudes and Problems Within the Church, Autor: Isom II, O. C., Verlag: AuthorHouse, Sprache: Englisch, Schlagworte: BUSINESS & ECONOMICS // Workplace Culture, Rubrik: Wirtschaft // Allgemeines, Lexika, Geschichte, Seiten: 306, Informationen: Paperback, Gewicht: 446 gr, Verkäufer: averdo- Shop: averdo
- Price: 28.59 EUR excl. shipping
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Isom II, O. C.: Wounds Caused by Gossip Attitudes and Conflicts in the Workplace
Erscheinungsdatum: 03.07.2014, Medium: Taschenbuch, Einband: Kartoniert / Broschiert, Titel: Wounds Caused by Gossip Attitudes and Conflicts in the Workplace, Titelzusatz: How to Deal with Difficult People and Situations on the Job, Autor: Isom II, O. C., Verlag: AuthorHouse, Sprache: Englisch, Schlagworte: BUSINESS & ECONOMICS // Workplace Culture, Rubrik: Wirtschaft // Allgemeines, Lexika, Geschichte, Seiten: 186, Informationen: Paperback, Gewicht: 279 gr, Verkäufer: averdo- Shop: averdo
- Price: 23.39 EUR excl. shipping
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Isom II, O. C.: Wounds Caused by Gossip Attitudes and Conflicts in the Workplace
Erscheinungsdatum: 03.07.2014, Medium: Buch, Einband: Gebunden, Titel: Wounds Caused by Gossip Attitudes and Conflicts in the Workplace, Titelzusatz: How to Deal with Difficult People and Situations on the Job, Autor: Isom II, O. C., Verlag: AuthorHouse, Sprache: Englisch, Schlagworte: BUSINESS & ECONOMICS // Workplace Culture, Rubrik: Wirtschaft // Allgemeines, Lexika, Geschichte, Seiten: 186, Informationen: HC gerader Rücken kaschiert, Gewicht: 431 gr, Verkäufer: averdo- Shop: averdo
- Price: 34.79 EUR excl. shipping
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FM 24C16B-G - FRAM, 16 Kb (2 K x 8), 4,5 … 5,5 V, SO-8
16Kb Serial FRAM 5V, 2kx8, 1MHz, SO8The FM24C16B is a 16-kilobit nonvolatile memory employing an advanced ferroelectric process. A ferroelectric random access memory or FRAM is nonvolatile and performs reads and writes like a RAM. It provides reliable data retention for 38 years while eliminating the complexities, overhead, and system level reliability problems caused by EEPROM and other nonvolatile memories.- Shop: reichelt elektronik
- Price: 4.45 EUR excl. shipping
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FM 24C04B-G - FRAM, 4 Kb (512 x 8), 4,5 … 5,5 V, SO-8
4-Kbit Serial (I2C) FRAM, 512x8, 5V, 1MHz, SO8, The FM24C04B is a 4-Kbit nonvolatile memory employing an advanced ferroelectric process. A ferroelectric random access memory or F-RAM is nonvolatile and performs reads and writes similar to a RAM. It provides reliable data retention for 151 years while eliminating the complexities, overhead, and system-level reliability problems caused by EEPROM and other nonvolatile memories.- Shop: reichelt elektronik
- Price: 2.65 EUR excl. shipping
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FM 24C64B-G - FRAM, 64 Kb (8 K x 8), 4,5 … 5,5 V, SO-8
64-Kbit (8K×8) Serial (I2C) F-RAM, 5V, 1MHz, SO8The FM24C64B is a 64-Kbit nonvolatile memory employing an advanced ferroelectric process. A ferroelectric random access memory or F-RAM is nonvolatile and performs reads and writes similar to a RAM. It provides reliable data retention for 151 years while eliminating the complexities, overhead, and system-level reliability problems caused by EEPROM and other nonvolatile memories.- Shop: reichelt elektronik
- Price: 4.30 EUR excl. shipping
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FM 25040B-G - FRAM, 4 Kb (512 x 8), 4,5 … 5,5 V, SO-8
4-Kbit (512×8) Serial (SPI) F-RAM, 5V, 20MHz SO8The FM25040B is a 4-Kbit nonvolatile memory employing an advanced ferroelectric process. A ferroelectric random access memory or F-RAM is nonvolatile and performs reads and writes similar to a RAM. It provides reliable data retention for 151 years while eliminating the complexities, overhead, and system level reliability problems caused by serial flash, EEPROM, and other nonvolatile memories.- Shop: reichelt elektronik
- Price: 2.75 EUR excl. shipping